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Vacuum Prober System Product List and Ranking from 4 Manufacturers, Suppliers and Companies

Vacuum Prober System Product List

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Peripheral Equipment Vacuum Prober System

The birth of a new vacuum system in response to customer needs!

Our company designs, manufactures, and sells a new vacuum system, the "Peripheral Equipment Vacuum Prober System," in response to customer needs. 【Features】 ○ The vacuum chamber has a larger design with internal dimensions of φ150 (inner diameter) x 90 mm (height), allowing for cooling and heating mechanisms, as well as adaptability for research purposes. ○ Main body dimensions: 420 mm (width) x 420 mm (depth) x 545 mm (height) ○ Chamber internal dimensions: φ150 (inner diameter) x 90 mm (height) ○ Aluminum door: Viewing window (effective visible diameter: Φ96 mm) ○ External feedthrough ports (NW40): 3 ports ○ Vacuum exhaust port (NW40): 1 port ○ Probe movement mechanism: X-Y-Z stage with a movement range of ±5 mm, with a graduated moving seal section and vacuum bellows ○ Probe tip fixture: Capable of tilting at the tip (screw-fixed) ○ Probe: Tungsten needle (tip 25 μm) ○ Sample stage dimensions: φ70 mm grounded type ○ Maximum substrate: 30 mm ○ High vacuum valve: NW40 angle valve

  • Vacuum Equipment

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Prober Vacuum Prober System for Thermoelectric Characterization Evaluation

- Optimal for measuring the Seebeck coefficient - Enabled measurement of the sample surface temperature based on a vacuum prober system.

- Optimal for measuring the Seebeck coefficient - Enabled measurement of sample surface temperature based on a vacuum prober system. - Surface temperature measurement mechanism: Capable of measuring the sample surface temperature (optional) - Equipped with heating and cooling mechanism: Capable of creating a temperature difference at both ends of the sample - Can be modified for low or high temperature specifications (optional)

  • Semiconductor inspection/test equipment
  • Other physicochemical equipment
  • probe

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Vacuum Prober System "SB-MCPS Series"

A vacuum prober system that allows selection of temperatures from ultra-low to high!

The "SB-MCPS Series" is a vacuum prober system that can accommodate a wide range of temperatures from low to high, with a variety of options available. We offer low and high temperature options, including a liquid nitrogen cooling unit (80K to 500K), a liquid helium flow-type cooling unit (5K to 300K), and a high-temperature unit (room temperature to 600K). You can select temperatures from ultra-low to high. 【Specifications】 ■ Temperature Range: Room Temperature ■ Sample Size: Up to 20mm ■ Movement Range: X-axis ±25.0mm, Y-axis ±15.0mm, Z-axis ±12.5mm ■ Connector: BNC Connector ■ Frame Dimensions: W550mm × D550mm *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Vacuum Equipment

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Prober Vacuum <Low Temperature> Prober System

We offer a wide range of options to meet various demands from low temperatures to high temperatures.

The SB-MCPS series vacuum <low temperature> prober system offers a variety of low and high temperature options, making it suitable for various temperature ranges. In addition to standard systems, we also have experience in manufacturing probers for spintronics that combine low temperature, RF, and magnetic fields, as well as space-saving mini probers tailored to measurement spaces, and probers equipped with electromagnets and infrared cameras. We can also customize and propose solutions based on the functions and performance required for your desired measurements.

  • Semiconductor inspection/test equipment
  • probe
  • Other physicochemical equipment

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Prober Vacuum <Low Temperature> Prober System

We offer a wide range of options to meet various demands from low temperatures to high temperatures.

The SB-MCPS series vacuum <low temperature> prober system offers a variety of low and high temperature options, making it suitable for various temperature ranges. In addition to standard systems, we have experience in manufacturing probers for spintronics that combine low temperature, RF, and magnetic fields, as well as space-saving mini probers tailored to measurement spaces, and probers equipped with electromagnets and infrared cameras. We can also customize and propose solutions based on the required functions and performance for your desired measurements.

  • Semiconductor inspection/test equipment
  • probe
  • Other physicochemical equipment

Added to bookmarks

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Bookmark has been removed

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You can't add any more bookmarks

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